首页> 外国专利> NON-CONTACT SURFACE SHAPE MEASUREMENT METHOD AND DEVICE USING WHITE LIGHT INTERFEROMETER OPTICAL HEAD

NON-CONTACT SURFACE SHAPE MEASUREMENT METHOD AND DEVICE USING WHITE LIGHT INTERFEROMETER OPTICAL HEAD

机译:白光干涉仪光学头的非接触表面形状测量方法及装置

摘要

PROBLEM TO BE SOLVED: To allow a correct spatial sampling to improve measurement accuracy, make processing efficient, and improve reliability even when using drive means of which a movement velocity is not constant.SOLUTION: In a non-contact surface shape measurement method using a white light interferometer optical head 10 configured to: divide light irradiated from a white light source 12 by a beam splitter 16 into reference light to a reference mirror 20 and measurement light to a measurement object surface (W); and acquire an interference fringe image generated by an optical path difference between the light reflected upon the reference mirror and the measurement object surface, in which the interference fringe image is acquired while scanning the white light interferometer optical head 10 in a vertical direction with respect to the measurement object surface (W), the method is configured to: move the white light interferometer optical head 10 in a scan direction, and detect the scan direction; and acquire the interference fringe image for each prescribed position interval of the scan direction.SELECTED DRAWING: Figure 4
机译:解决的问题:即使使用运动速度不恒定的驱动装置,也可以进行正确的空间采样以提高测量精度,提高处理效率并提高可靠性。白光干涉仪光学头10被配置为:将由分束器16从白光源12照射的光分成到参考镜20的参考光和到测量对象表面(W)的测量光;以及并获取由在参考镜上反射的光与测量对象表面之间的光程差产生的干涉条纹图像,其中,在相对于垂直方向扫描白光干涉仪光学头10时,获得干涉条纹图像。测量对象表面(W),该方法被配置为:在扫描方向上移动白光干涉仪光学头10,并检测扫描方向;并针对扫描方向的每个指定位置间隔获取干涉条纹图像。选定的绘制:图4

著录项

  • 公开/公告号JP2016090520A

    专利类型

  • 公开/公告日2016-05-23

    原文格式PDF

  • 申请/专利权人 MITSUTOYO CORP;

    申请/专利号JP20140228465

  • 申请日2014-11-10

  • 分类号G01B11/24;G01B9/02;

  • 国家 JP

  • 入库时间 2022-08-21 14:46:57

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