首页> 外国专利> X-RAY ENERGY SPECTRUM MEASURING METHOD, X-RAY ENERGY SPECTRUM MEASURING DEVICE AND X-RAY CT DEVICE

X-RAY ENERGY SPECTRUM MEASURING METHOD, X-RAY ENERGY SPECTRUM MEASURING DEVICE AND X-RAY CT DEVICE

机译:X射线能谱测量方法,X射线能谱测量装置和X射线CT装置

摘要

PROBLEM TO BE SOLVED: To provide an X-ray energy spectrum measuring method capable of executing the reconfiguration of a CT image with high accuracy by reproducing attenuation path information irradiated with X-rays with high accuracy by making an energy spectrum emitted from an X-ray source device estimatable with high accuracy.;SOLUTION: An energy spectrum estimation device 92 normalizes a response function, and calculates a correction efficiency matrix from the normalized response function, a detection efficiency matrix and a measuring system correction coefficient. The calculated correction efficiency matrix, the normalized response function, and an attenuation characteristic curve supplied from a measuring circuit 30 are used to acquire a result by a Bayesian estimation expression without divergence. The energy spectrum estimation device 92 subtracts the result acquired by the Bayesian estimation expression to calculate an X-ray energy spectrum in the normalized correction efficiency matrix.;COPYRIGHT: (C)2016,JPO&INPIT
机译:解决的问题:提供一种X射线能谱测量方法,该方法能够通过使从X-射线发射的能谱以高精度再现由X射线照射的衰减路径信息,从而能够以高精度执行CT图像的重构。能量谱估计装置92对响应函数进行归一化,并从归一化的响应函数,检测效率矩阵和测量系统校正系数中计算出校正效率矩阵。从测量电路30提供的计算出的校正效率矩阵,归一化响应函数和衰减特性曲线用于无偏差地通过贝叶斯估计表达式获取结果。能量谱估计装置92减去由贝叶斯估计表达式获得的结果,以计算归一化校正效率矩阵中的X射线能量谱。COPYRIGHT:(C)2016,JPO&INPIT

著录项

  • 公开/公告号JP2015204985A

    专利类型

  • 公开/公告日2015-11-19

    原文格式PDF

  • 申请/专利权人 HITACHI LTD;

    申请/专利号JP20140086712

  • 发明设计人 MURATA ISAO;TAKAGI HIROYUKI;

    申请日2014-04-18

  • 分类号A61B6/03;

  • 国家 JP

  • 入库时间 2022-08-21 14:46:23

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