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X-ray energy spectrum measuring method, X-ray energy spectrum measuring apparatus and X-ray CT apparatus

机译:X射线能谱测量方法,X射线能谱测量设备和X射线CT设备

摘要

Provided is an X-ray energy spectrum estimation method capable of reproducing, with high precision, information on an attenuation path to which an X-ray is irradiated, and performing, with high precision, reconstruction of an X-ray CT image by enabling high-precision estimation of spectrum of energy released from an X-ray source device 10. An energy spectrum estimation device 92 normalizes a response function, and calculates a modified efficiency matrix from the normalized response function, a detection efficiency matrix, and a measurement-system correction coefficient. The energy spectrum estimation device 92 then calculates a particular result in accordance with a Bayesian estimation equation, without divergence, with use of the calculated modified efficiency matrix, the normalized modified efficiency matrix, and an attenuation characteristic curve obtained by a measurement circuit 30. The energy spectrum estimation device 92 calculates an X-ray energy spectrum by dividing, by the normalized modified efficiency matrix, the particular result obtained by the Bayesian estimation equation.
机译:提供了一种X射线能谱估计方法,该方法能够高精度地再现关于被照射了X射线的衰减路径的信息,并且能够通过高精度地再现X射线CT图像来进行重构。 X射线源设备10释放的能量谱的精确估计。能量谱估计设备92对响应函数进行归一化,并根据归一化的响应函数,检测效率矩阵和测量系统来计算修改后的效率矩阵。校正系数。能量谱估计装置92然后使用计算出的修正效率矩阵,归一化修正效率矩阵和由测量电路30获得的衰减特性曲线,根据贝叶斯估计方程无偏差地计算特定结果。能量谱估计装置92通过将归一化的改进效率矩阵除以贝叶斯估计方程获得的特定结果来计算X射线能量谱。

著录项

  • 公开/公告号JP6133231B2

    专利类型

  • 公开/公告日2017-05-24

    原文格式PDF

  • 申请/专利权人 株式会社日立製作所;

    申请/专利号JP20140086712

  • 发明设计人 村田 勲;高木 寛之;

    申请日2014-04-18

  • 分类号A61B6/03;

  • 国家 JP

  • 入库时间 2022-08-21 13:55:58

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