首页> 外国专利> SELF-STANDING GaN SUBSTRATE, GaN CRYSTAL, GaN SINGLE CRYSTAL MANUFACTURING METHOD, AND SEMICONDUCTOR DEVICE MANUFACTURING METHOD

SELF-STANDING GaN SUBSTRATE, GaN CRYSTAL, GaN SINGLE CRYSTAL MANUFACTURING METHOD, AND SEMICONDUCTOR DEVICE MANUFACTURING METHOD

机译:自立GaN基板,GaN晶体,GaN单晶制造方法和半导体器件制造方法

摘要

PROBLEM TO BE SOLVED: To provide a nonpolar or semipolar GaN substrate having an improved size and a crystal quality.SOLUTION: A self-standing GaN substrate has an angle of 0 degrees to 20 degrees between the normal line of a main surface and an m axis, and a low-strain section, in which the size of a c-axis direction of a projected image at the time when said main surface is normally projected on an M face is 10 mm or more, and in which the section length is 6 mm or more whereas the a-axis length fluctuation within a section is at or less than 10.0×10angstroms.
机译:解决的问题:提供具有改善的尺寸和晶体质量的非极性或半极性的GaN衬底。解决方案:自立式GaN衬底在主表面的法线与m之间的夹角为0度到20度。轴和低应变截面,其中所述主表面正常投影在M面上时的投影图像的c轴方向尺寸为10mm或更大,且截面长度为截面内的a轴长度波动为6mm或更大,而等于或小于10.0×10埃。

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