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Subject light measuring device and the subject optical measurement method

机译:被摄体光测量装置和被摄体光学测量方法

摘要

PROBLEM TO BE SOLVED: To provide an analyte optical measurement apparatus for measuring physical property information in the depth part of an analyte by a diffuse optical tomography with higher resolution than that of a conventional DOT (Diffuse Optical Tomography) measurement apparatus.;SOLUTION: The analyte optical measurement apparatus by a diffuse optical tomography includes: one or more first light sources and first detectors disposed in an analyte; one or more second light sources and second detectors disposed outside the analyte; and a processing part for processing a measurement value to be obtained from one or more measurement rays of light emitted from the first light source, and made incident to at least one of the first and second detectors and one or more measurement rays of light emitted from the second light source, and made incident to at least one of the first and second detectors, and for reconfiguring the distribution of the scattering coefficients or absorption coefficients of the analyte.;COPYRIGHT: (C)2013,JPO&INPIT
机译:解决的问题:提供一种分析物光学测量装置,该装置通过扩散光学层析成像技术来测量分析物深度部分的物理性质信息,其分辨率高于传统的DOT(漫射光学层析成像)测量装置。通过扩散光学层析成像的分析物光学测量设备包括:一个或多个第一光源和设置在分析物中的第一检测器;置于分析物外部的一个或多个第二光源和第二检测器;以及处理部,其对从第一光源发出的一条或多条测量光线获得的测量值进行处理,并入射到第一检测器和第二检测器中的至少一个以及从第一光源发出的一条或多条测量光线。第二光源,并入射到第一和第二检测器中的至少一个,并用于重新配置分析物的散射系数或吸收系数的分布。;版权所有:(C)2013,JPO&INPIT

著录项

  • 公开/公告号JP6004634B2

    专利类型

  • 公开/公告日2016-10-12

    原文格式PDF

  • 申请/专利权人 キヤノン株式会社;

    申请/专利号JP20110245106

  • 发明设计人 内田 護;堀 雄一郎;

    申请日2011-11-09

  • 分类号G01N21/17;

  • 国家 JP

  • 入库时间 2022-08-21 14:44:45

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