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COMPOSITION ANALYSIS METHOD, COMPOSITION ANALYSIS DEVICE, AND COMPOSITION ANALYSIS PROGRAM

机译:组成分析方法,组成分析装置和组成分析程序

摘要

PROBLEM TO BE SOLVED: To find the composition of an element added to a chemical compound with high accuracy by using X-ray spectrometry.SOLUTION: The composition ratio of first and second elements of a chemical compound in which a portion of a first element among the first and second elements of a stoichiometric compound is replaced with an impurity element is found using X-ray spectrometry (steps S1, S2). The first and second elements are such elements that their X-ray absorption to a chemical compound when obtaining mutual characteristic X rays by X-ray spectrometry, for example, can be considered to be approximately the same. The composition of the first element in the chemical compound is found using the composition ratio of first and second elements found for such a chemical compound and the composition of the second element in the chemical compound (step S3), and the composition of the impurity element in the chemical compound is found using the obtained composition of the first element in the chemical compound (step S4).SELECTED DRAWING: Figure 3
机译:解决的问题:使用X射线光谱法高精度地找到添加到化合物中的元素的组成解决方案:化合物中第一元素和第二元素的组成比,其中第一元素的一部分使用X射线光谱法发现化学计量化合物的第一和第二元素被杂质元素取代(步骤S1,S2)。第一元素和第二元素是这样的元素,例如,当通过X射线光谱法获得互有特征的X射线时,可以认为它们对化合物的X射线吸收近似相同。使用针对该化合物发现的第一元素和第二元素的组成比和该化合物中第二元素的组成以及杂质元素的组成,求出化合物中第一元素的组成。使用所获得的化合物中第一元素的组成来查找化合物中的化合物(步骤S4)。选定的图:图3

著录项

  • 公开/公告号JP2016045122A

    专利类型

  • 公开/公告日2016-04-04

    原文格式PDF

  • 申请/专利权人 FUJITSU LTD;

    申请/专利号JP20140170492

  • 发明设计人 YAMAGUCHI HIDESHI;

    申请日2014-08-25

  • 分类号G01N23/225;G01N23/04;

  • 国家 JP

  • 入库时间 2022-08-21 14:43:48

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