首页> 外国专利> Aspheric measurement method, a manufacturing method of aspheric measuring device, the optical element processing device and an optical element

Aspheric measurement method, a manufacturing method of aspheric measuring device, the optical element processing device and an optical element

机译:非球面测量方法,非球面测量装置的制造方法,光学元件处理装置和光学元件

摘要

PROBLEM TO BE SOLVED: To collectively measure the shape of an aspherical surface whose curvature change is large in the radial direction.;SOLUTION: In the aspherical surface measurement method, light from a light source 1 is irradiated to surfaces to be inspected 9 to 11 which are aspherical surfaces as illumination light of a spherical wave through an illumination optical system 5, reflected light at the surface to be inspected is introduced to a light-receiving sensor 8 through an imaging optical system 7 as detection light, and the shape of the surface to be inspected is measured using the output from the light-receiving sensor. In the method, a curvature of a wavefront of the illumination light, and an exit pupil of the imaging optical system, having the light-receiving sensor as an object surface, are formed in such a manner that the absolute value of the angle of the detection light is smaller than the maximum value of the absolute value of the angle of peripheral rays of the imaging optical system. Furthermore, a sensor conjugate surface, which is in a conjugate relation with the light-receiving sensor by the imaging optical system, is made to have a curvature and to be in a position in which rays of the detection light do not intersect on the sensor conjugate surface. The sensor conjugate surface, the wavefront of the illumination light, and the surface to be inspected are all aligned to either a convex surface or a concave surface directing the same side in the optical axis direction.;COPYRIGHT: (C)2013,JPO&INPIT
机译:解决的问题:集中地测量半径方向上曲率变化大的非球面的形状。解决方案:非球面测量方法中,来自光源1的光照射到要检查的表面9至11作为非球面的球面光通过照明光学系统5作为球面波的照明光,被检查表面的反射光通过成像光学系统7作为检测光被引入到光接收传感器8,并且其形状使用受光传感器的输出来测量要检查的表面。在该方法中,以使光接收角的绝对值如下的方式形成照明光的波前的曲率和具有光接收传感器作为被摄体表面的成像光学系统的出射光瞳。检测光小于成像光学系统的外围光线的角度的绝对值的最大值。此外,使通过成像光学系统与光接收传感器处于共轭关系的传感器共轭表面具有曲率并且处于检测光的射线不与传感器相交的位置。共轭表面。传感器共轭表面,照明光的波阵面和要检查的表面都对准在光轴方向上指向同一侧的凸面或凹面。;版权所有:(C)2013,JPO&INPIT

著录项

  • 公开/公告号JP6000578B2

    专利类型

  • 公开/公告日2016-09-28

    原文格式PDF

  • 申请/专利权人 キヤノン株式会社;

    申请/专利号JP20120052423

  • 发明设计人 前田 義紀;

    申请日2012-03-09

  • 分类号G01B11/24;

  • 国家 JP

  • 入库时间 2022-08-21 14:41:27

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