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Method for manufacturing the same, and low -ray bismuth and bismuth alloy of low -ray bismuth
Method for manufacturing the same, and low -ray bismuth and bismuth alloy of low -ray bismuth
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机译:一种低射线铋的制造方法以及低射线铋和低铋的铋合金
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摘要
Provided is a bismuth characterized in that the bismuth emits 0.01 cph/cm2 or less of α rays. Also provided is a method for producing a low α-emitting bismuth, characterized in that a titanium cathode and a bismuth anode are introduced to a nitric acid solution having a bismuth concentration of 5 to 50 g/L and pH of 0.0 to 0.4, and electrolytic purification is performed at a cathode current density of 0.1 to 1 A/dm2. Recent semiconductor devices are high density and high capacity and therefore are subject to increased risk of soft error due to the effects of α rays emitted from materials in the vicinity of the semiconductor chips. In particular, there is a strong demand for high-purity solder materials used near the semiconductor device, and there is a demand for a low α-emitting material. Therefore, the problem of the present invention is to elucidate the phenomenon of α ray generation by bismuth and to obtain a low α ray-emitting, high-purity bismuth that can be applied to the materials which are demanded, and an alloy thereof.
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机译:提供一种铋,其特征在于,所述铋发射出小于等于0.01cph / cm 2的α。射线。还提供了一种生产低α-发射铋的方法,其特征在于将钛阴极和铋阳极引入到铋浓度为5至50g / L且pH为0.0至0.4的硝酸溶液中,阴极电流密度为0.1〜1A / dm 2进行电解精制。最近的半导体器件具有高密度和高容量,因此由于α的影响而遭受软错误的风险增加。从半导体芯片附近的材料发出的射线。特别地,强烈需要在半导体器件附近使用的高纯度焊料材料,并且需要低α发射材料。因此,本发明的问题是阐明α现象。通过铋产生射线并获得低α值;可以应用于所需材料的可发射射线的高纯铋及其合金。
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