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Method for manufacturing the same, and low -ray bismuth and bismuth alloy of low -ray bismuth

机译:一种低射线铋的制造方法以及低射线铋和低铋的铋合金

摘要

Provided is a bismuth characterized in that the bismuth emits 0.01 cph/cm2 or less of α rays. Also provided is a method for producing a low α-emitting bismuth, characterized in that a titanium cathode and a bismuth anode are introduced to a nitric acid solution having a bismuth concentration of 5 to 50 g/L and pH of 0.0 to 0.4, and electrolytic purification is performed at a cathode current density of 0.1 to 1 A/dm2. Recent semiconductor devices are high density and high capacity and therefore are subject to increased risk of soft error due to the effects of α rays emitted from materials in the vicinity of the semiconductor chips. In particular, there is a strong demand for high-purity solder materials used near the semiconductor device, and there is a demand for a low α-emitting material. Therefore, the problem of the present invention is to elucidate the phenomenon of α ray generation by bismuth and to obtain a low α ray-emitting, high-purity bismuth that can be applied to the materials which are demanded, and an alloy thereof.
机译:提供一种铋,其特征在于,所述铋发射出小于等于0.01cph / cm 2的α。射线。还提供了一种生产低α-发射铋的方法,其特征在于将钛阴极和铋阳极引入到铋浓度为5至50g / L且pH为0.0至0.4的硝酸溶液中,阴极电流密度为0.1〜1A / dm 2进行电解精制。最近的半导体器件具有高密度和高容量,因此由于α的影响而遭受软错误的风险增加。从半导体芯片附近的材料发出的射线。特别地,强烈需要在半导体器件附近使用的高纯度焊料材料,并且需要低α发射材料。因此,本发明的问题是阐明α现象。通过铋产生射线并获得低α值;可以应用于所需材料的可发射射线的高纯铋及其合金。

著录项

  • 公开/公告号JP5903497B2

    专利类型

  • 公开/公告日2016-04-13

    原文格式PDF

  • 申请/专利权人 JX金属株式会社;

    申请/专利号JP20140544474

  • 发明设计人 伊藤 順一;細川 侑;

    申请日2013-10-25

  • 分类号C25C1/22;C22C12/00;C22C13/02;C22B30/06;B23K35/26;

  • 国家 JP

  • 入库时间 2022-08-21 14:41:16

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