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Spectral characteristic measuring device, the spectral characteristic measuring method, a planar object to be measured quality monitoring equipment

机译:光谱特性测量装置,光谱特性测量方法,待测平面物体质量监测设备

摘要

PROBLEM TO BE SOLVED: To provide a spectral characteristic measuring device which utilizes measurement results of a displacement sensor using a spectrograph.;SOLUTION: A spectral characteristic measuring device 10 measures spectral characteristics of a field of measurement of a planar measuring object, comprises a displacement sensor equipped with: a light source unit 200 which irradiates light whose wavelength varies depending on an emission direction to be generated by obliquely making the light incident on an optical element using a dielectric multilayer film at a fixed angle by a light source optical axis in an oblique direction to a surface including the field of measurement; a spectrograph 300 which measures spectral distribution of reflected light in the field of measurement; a feature quantity extraction part 120 which extracts feature quantities of the spectral distribution; and a displacement calculation part 130 which calculates displacement of the field of measurement based on the extracted feature quantities, and relation between the preliminarily acquired feature quantities and the displacement, and corrects the measured spectral characteristics by utilizing measurement results of the displacement sensor.;COPYRIGHT: (C)2015,JPO&INPIT
机译:解决的问题:提供一种利用光谱仪利用位移传感器的测量结果的光谱特征测量装置。解决方案:光谱特征测量装置10测量平面测量对象的测量场的光谱特征,包括位移该传感器具备:光源单元200,该光源单元200通过使用介质多层膜使光通过光源光轴以一定角度倾斜入射在光学元件上而产生波长根据发射方向而变化的光。相对于包括测量场在内的表面的倾斜方向;光谱仪300,其测量在测量领域中反射光的光谱分布;特征量提取部120,提取光谱分布的特征量。位移计算部分130,其基于所提取的特征量以及预先获取的特征量与位移之间的关系来计算测量场的位移,并利用位移传感器的测量结果来校正所测量的光谱特性。 :(C)2015,JPO&INPIT

著录项

  • 公开/公告号JP5907364B2

    专利类型

  • 公开/公告日2016-04-26

    原文格式PDF

  • 申请/专利权人 横河電機株式会社;

    申请/专利号JP20150028867

  • 发明设计人 西田 和史;辻井 敦;千田 直道;

    申请日2015-02-17

  • 分类号G01J3/50;G01J3/02;G01N21/27;G01N21/57;

  • 国家 JP

  • 入库时间 2022-08-21 14:40:34

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