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NON-LINEAR OPTICAL ELLIPSOMETRY FOR SURFACE MONITORING AND CHARACTERIZATION
NON-LINEAR OPTICAL ELLIPSOMETRY FOR SURFACE MONITORING AND CHARACTERIZATION
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机译:非线性光学椭圆仪用于表面监测和表征
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摘要
The present disclosure relates to monitoring, evaluating and interrogating material surfaces using second-order nonlinear optical ellipsometry for surface monitoring and characterization.
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