SYSTEM AND METHOD FOR INTEGRATED CIRCUIT USAGE TRACKING CIRCUIT WITH FAST TRACKING TIME FOR HARDWARE SECURITY AND RE-CONFIGURABILITY

摘要

An accelerated aging circuit is described to shorten the required stress time to a few seconds of operation. Due to the challenges posed by process variation in advanced CMOS technology, a stochastic processing methodology is also described to reduce the failure rate of the tracking and detection. Combining both circuit and system level acceleration, the creation of a silicon marker can be realized within seconds of usage in contrast with days of operation from previously reported aging monitor.