首页> 外国专利> STACKED SEMICONDUCTOR DIE ASSEMBLIES WITH THERMAL SPACERS AND ASSOCIATED SYSTEMS AND METHODS

STACKED SEMICONDUCTOR DIE ASSEMBLIES WITH THERMAL SPACERS AND ASSOCIATED SYSTEMS AND METHODS

机译:具有热间隔器的叠层半导体芯片组件以及相关的系统和方法

摘要

Stacked semiconductor die assemblies with thermal spacers and associated systems and methods are disclosed herein. In one embodiment, a semiconductor die assembly can include a thermally conductive casing defining a cavity, a stack of first semiconductor dies within the cavity, and a second semiconductor die stacked relative to the stack of first dies and carried by a package substrate. The semiconductor die assembly further includes a thermal spacer disposed between the package substrate and the thermally conductive casing. The thermal spacer can include a semiconductor substrate and plurality of conductive vias extending through the semiconductor substrate and electrically coupled to the stack of first semiconductor dies, the second semiconductor die, and the package substrate.
机译:本文公开了具有热隔离物的堆叠的半导体管芯组件以及相关的系统和方法。在一个实施例中,半导体管芯组件可以包括:限定壳体的导热壳体;在该空腔内的第一半导体管芯的堆叠;以及相对于第一管芯的堆叠而堆叠并且由封装基板承载的第二半导体管芯。半导体管芯组件还包括布置在封装基板和导热壳体之间的热隔离物。热隔离物可以包括半导体衬底和延伸穿过半导体衬底并且电耦合到第一半导体管芯,第二半导体管芯和封装衬底的堆叠的多个导电通孔。

著录项

  • 公开/公告号US2016181125A1

    专利类型

  • 公开/公告日2016-06-23

    原文格式PDF

  • 申请/专利权人 MICRON TECHNOLOGY INC.;

    申请/专利号US201615059076

  • 申请日2016-03-02

  • 分类号H01L21/48;H01L23/42;H01L21/56;H01L23/373;H01L25;H01L23;

  • 国家 US

  • 入库时间 2022-08-21 14:35:53

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号