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Fractional-N All Digital Phase Locked Loop Incorporating Look Ahead Time To Digital Converter

机译:小数N位全数字锁相环,集成了数字转换器的前瞻性时间

摘要

A novel and useful look-ahead time to digital converter (TDC) that is applied to an all digital phase locked loop (ADPLL) as the fractional phase error detector. The deterministic nature of the phase error during frequency/phase lock is exploited to achieve a reduction in power consumption of the TDC. The look-ahead TDC circuit is used to construct a cyclic DTC-TDC pair which functions to reduce fractional spurs of the output spectrum in near-integer channels by randomly rotating the cyclic DTC-TDC structure so that it starts from a different point every reference clock thereby averaging out the mismatch of the elements. Associated rotation and dithering methods are also presented. The ADPLL is achieved using the look-ahead TDC and/or cyclic DTC-TDC pair circuit.
机译:一种新颖且有用的超前时间数字转换器(TDC),可作为分数阶相位误差检测器应用于全数字锁相环(ADPLL)。利用频率/锁相期间的相位误差的确定性来实现TDC功耗的降低。前瞻性TDC电路用于构建循环DTC-TDC对,其功能是通过随机旋转循环DTC-TDC结构,以减少每个整数从参考的不同点开始,从而减少近整数通道中输出频谱的分数杂散时钟,从而平均出元素的不匹配。还介绍了相关的旋转和抖动方法。 ADPLL是使用前瞻性TDC和/或循环DTC-TDC对电路实现的。

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