首页> 外国专利> APPLYING SUBSTANTIALLY THE SAME VOLTAGE DIFFERENCES ACROSS MEMORY CELLS AT DIFFERENT LOCATIONS ALONG AN ACCESS LINE WHILE PROGRAMMING

APPLYING SUBSTANTIALLY THE SAME VOLTAGE DIFFERENCES ACROSS MEMORY CELLS AT DIFFERENT LOCATIONS ALONG AN ACCESS LINE WHILE PROGRAMMING

机译:在编程过程中,沿存取线在不同位置基本上在整个存储单元上应用相同的电压差异

摘要

An embodiment of a method of programing might include applying a first voltage difference across a first memory cell to be programed, where applying the first voltage difference comprises applying a first channel bias voltage to a channel of the first memory cell, and applying a second voltage difference, substantially equal to the first voltage difference, across a second memory cell to be programed while applying the first voltage difference across the first memory-cell, where applying the second voltage difference comprises applying a second channel bias voltage to a channel of the second memory cell. The first channel bias voltage is different than the second channel bias voltage, and the first memory cell and the second memory cell are commonly coupled to an access line and are at different locations along a length of the access line.
机译:编程方法的实施例可以包括在要编程的第一存储单元上施加第一电压差,其中施加第一电压差包括向第一存储单元的沟道施加第一沟道偏置电压,以及施加第二电压。在要对第一存储单元施加第一电压差的同时,在要编程的第二存储单元上施加与第一电压差基本相等的差,其中,施加第二电压差包括向第二存储单元的沟道施加第二沟道偏置电压。存储单元。第一沟道偏置电压与第二沟道偏置电压不同,并且第一存储单元和第二存储单元共同耦合至访问线,并且沿着访问线的长度位于不同的位置。

著录项

  • 公开/公告号US2016163388A1

    专利类型

  • 公开/公告日2016-06-09

    原文格式PDF

  • 申请/专利权人 MICRON TECHNOLOGY INC.;

    申请/专利号US201414558900

  • 发明设计人 RAMIN GHODSI;FENG PAN;

    申请日2014-12-03

  • 分类号G11C16/10;

  • 国家 US

  • 入库时间 2022-08-21 14:33:02

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