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Design-for-test techniques for a digital electronic circuit
Design-for-test techniques for a digital electronic circuit
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机译:数字电子电路的测试设计技术
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摘要
A digital electronic circuit (DCCT) configured for testing in accordance with a Design-for-Test (“DFT”) technique such as a hierarchical, compressed random access scan (“CRAS-N”) DFT technique and, in particular, a segmented, random access scan a (“SRAS”) DFT technique.
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