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Method and apparatus for investigating the X-ray radiographic properties of samples
Method and apparatus for investigating the X-ray radiographic properties of samples
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机译:用于研究样品的X射线射线照相特性的方法和设备
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摘要
The invention relates to a method and an apparatus for studying the X-ray properties of samples (3c), wherein X-ray radiation scattered by a sample (3c) is recorded by a detector (5) positioned at a distance from the sample (3c) and is evaluated with respect to the characteristics of the sample. According to the invention, it is provided that at a predetermined distance between the X-ray beam source (1) and the detector (5) or between the starting point (2b) of the X-ray beam (10) directed at the sample (3c) and the detector (5), for a predetermined number of successive measurements the distance (S1, S2) between the sample (3c) and the detector (5) is changed and is set at a predetermined different value.
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机译:本发明涉及用于研究样品( 3 B> c I>)的X射线特性的方法和设备,其中样品( 3 B> c I>)由与样品( 3 B> c < / I>),并根据样品的特性进行评估。根据本发明规定,在X射线束源( 1 B>)和检测器( 5 B>)之间的预定距离处或者在起点(<指向样品( 3 B> c <的X射线束( 10 B>)的B> 2 B> b I>) / I>)和检测器( 5 B>),对于预定数量的连续测量,其之间的距离(S 1 B>,S 2 B>)样本( 3 B> c I>)和检测器( 5 B>)被更改并设置为预定的不同值。
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