MARKING METHOD FOR THE REJECT MARKING OF TEST ELEMENTS

摘要

A marking method for marking test elements (112, 114, 116; 246, 254) is provided. The test elements (112, 114, 116; 246, 254) are adapted to detect at least one analyte in a sample (220). At least some of the test elements (112, 114, 116; 246, 254) are provided with a defect marking which contains information about defectiveness of the test elements (112, 114, 116; 246, 254). The test elements (112, 114, 116; 246, 254) have at least one radiation-sensitive material (202). The test elements (112, 114, 116; 246, 254) are exposed to at least one radiation (156), the radiation (156) being adapted to induce marking in the form of at least one optically detectable change in the radiation-sensitive material (202).