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BINARY CAPACITOR ARRAY APPLIED TO SINGLE-TERMINAL SAR ADC AND REDUNDANCY CALIBRATING METHOD THEREFOR

机译:用于单端SAR ADC的二进制电容器阵列及其冗余校准方法

摘要

Disclosed is a redundancy calibrating method for a binary capacitor array applied to a single-terminal SAR ADC. The method can be used for calibrating a dynamic error of the binary capacitor array caused by incomplete establishment. The method comprises a redundantly calibrated binary capacitor array, a comparer, an SAR logical control module and an output code computation module. The redundantly calibrated binary capacitor array comprises a binary capacitor array and an addition redundancy capacitor and a subtraction redundancy capacitor. According to the calibration method, a redundancy capacitor is inserted on the basis of a binary capacitor DAC array to realize that multiple digital codes correspond to one ADC analog input; whether an error exists is detected during redundant bit conversion; the addition redundancy capacitor or the subtraction redundancy capacitor is operated according to corresponding situations to compensate for the generated error.
机译:公开了一种应用于单端SAR ADC的二进制电容器阵列的冗余校准方法。该方法可用于校准由于建立不完全而引起的二元电容器阵列的动态误差。该方法包括冗余校准的二进制电容器阵列,比较器,SAR逻辑控制模块和输出代码计算模块。冗余校准的二进制电容器阵列包括二进制电容器阵列以及加法冗余电容器和减法冗余电容器。根据该校准方法,在二进制电容器DAC阵列的基础上插入一个冗余电容器,以实现多个数字代码对应一个ADC模拟输入。冗余位转换时是否检测到错误;加法冗余电容器或减法冗余电容器根据相应情况工作,以补偿所产生的误差。

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