首页> 外国专利> METHOD FOR MEASURING SCANNING TRAJECTORY OF OPTICAL SCANNING DEVICE, SCANNING TRAJECTORY MEASUREMENT DEVICE, AND IMAGE CALIBRATION METHOD

METHOD FOR MEASURING SCANNING TRAJECTORY OF OPTICAL SCANNING DEVICE, SCANNING TRAJECTORY MEASUREMENT DEVICE, AND IMAGE CALIBRATION METHOD

机译:光学扫描设备的扫描轨迹的测量方法,扫描轨迹的测量设备以及图像校准方法

摘要

Provided is a scanning trajectory measuring device for an optical scanning device that allows the effect of stray light to be easily reduced and the accuracy in measuring the scanning trajectory to be improved. A scanning trajectory measuring device for an optical scanning device 100 generates a display image of an irradiated object by scanning the irradiated object with illumination light, the scanning trajectory measuring device including a screen 11 scanned with the illumination light, and an optical position detector 12 for detecting the position of an irradiation spot from the illumination light on the screen 11. The scanning trajectory measuring device measures the scanning trajectory of the illumination light with the optical position detector 12 sequentially detecting the position of the irradiation spots at a plurality of predetermined time points during the scanning on the screen.
机译:本发明提供一种用于光学扫描装置的扫描轨迹测量装置,该光学轨迹扫描装置能够容易地减小杂散光的影响,并且能够提高测量扫描轨迹的精度。用于光学扫描装置的扫描轨迹测量装置100通过用照明光扫描被照射物体来生成被照射物体的显示图像,该扫描轨迹测量装置包括用照明光扫描的屏幕11,以及用于扫描物体的光学位置检测器12。从屏幕11上的照明光检测照射点的位置。扫描轨迹测量装置利用光学位置检测器12在多个预定时间点依次检测照射点的位置来测量照明光的扫描轨迹。在屏幕上扫描时。

著录项

  • 公开/公告号WO2016151633A1

    专利类型

  • 公开/公告日2016-09-29

    原文格式PDF

  • 申请/专利权人 OLYMPUS CORPORATION;

    申请/专利号WO2015JP01701

  • 发明设计人 NAMIKI MITSURU;

    申请日2015-03-25

  • 分类号G02B26/10;A61B1;G02B21/06;G02B23/26;

  • 国家 WO

  • 入库时间 2022-08-21 14:16:30

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