首页> 外国专利> 2-DIMENSIONAL MATERIAL ETCHING APPARATUS AND METHOD OF PATTERNING 2-DIMENSIONAL MATERIAL USING THE SAME

2-DIMENSIONAL MATERIAL ETCHING APPARATUS AND METHOD OF PATTERNING 2-DIMENSIONAL MATERIAL USING THE SAME

机译:二维材料刻蚀装置和使用该二维图案化方法对二维材料进行图案化的方法

摘要

Disclosed are a two-dimensional material etching apparatus and a method for patterning a two-dimensional material layer by using the same. The disclosed two-dimensional material layer etching apparatus includes: a stage where an object to be etched is placed; a light source for emitting light (for example, EUV or X-ray having a shorter wavelength than the same) with a shorter wavelength than a visible ray; a mask where a pattern to be transferred to the object to be etched is engraved; a fluid inlet for supplying a fluid onto the object to be etched; and a fluid absorption hole for absorbing a residual and a reactant after the fluid is supplied. The object to be etched is a graphene. The disclosed method for patterning the two-dimensional material layer includes the processes of: putting the object to be etched on the stage; irradiating a light to the object to be etched; supplying the fluid onto the object to be etched; and removing the fluid residual and the fluid reactant on the object to be etched. The object to be etched includes the graphene, and the wavelength of the light is shorter than the wavelength of the visible ray.
机译:公开了一种二维材料蚀刻设备以及通过使用该设备来图案化二维材料层的方法。所公开的二维材料层蚀刻设备包括:放置待蚀刻物体的台;以及用于放置待蚀刻物体的平台。用于发射波长比可见光短的光的光源(例如,EUV或波长短于X射线的X射线);刻有要转印到要蚀刻的物体上的图案的掩模;流体入口,用于将流体供应到待蚀刻的物体上;流体吸收孔,用于在供应流体之后吸收残余物和反应物。要蚀刻的物体是石墨烯。所公开的用于对二维材料层进行构图的方法包括以下步骤:将要蚀刻的物体放在平台上;以及将待蚀刻的物体放置在平台上。向要蚀刻的物体照射光;将流体供应到要蚀刻的物体上;去除待刻蚀物体上的流体残留和流体反应物。待蚀刻的物体包括石墨烯,并且光的波长短于可见光的波长。

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