METHOD OF ANALYZING A SAMPLE SURFACE USING A SCANNING PROBE MICROSCOPY AND SCANNING PROBE MICROSCOPY THEREFOR

摘要

The present invention provides a method to analyze a surface of a sample using a scanning probe microscope having a probe where a cell is attached, and the scanning probe microscope as an other aspect of analyzing the surface of the sample. The scanning probe microscope comprises: the probe; a scanner; and a deflection sensor.