首页> 外国专利> SILICON CARBIDE SCHOTTKY DIODE WITH IMPROVED FORWARD CHARACTERISTIC AND METHOD FOR MANUFACTURING SAME

SILICON CARBIDE SCHOTTKY DIODE WITH IMPROVED FORWARD CHARACTERISTIC AND METHOD FOR MANUFACTURING SAME

机译:具有改进的前向特性的碳化硅肖特基二极管及其制造方法

摘要

The present invention relates to a silicon carbide Schottky diode with improved forward characteristic and to a method for manufacturing the same. The method includes: a step of forming a metal layer having a Schottky metal layer, an extension barrier metal layer, and a pad metal layer stacked on the upper side of an epilayer; and a step of heat-treating the etched metal layer. Thereby, the extension barrier metal layer is formed between the pad metal layer and the Schottky metal layer so as to have an effect of preventing the Shottky metal layer from penetrating into the pad metal layer. Also, an interfacial resistance is reduced through high temperature heat treatment, and Schottky adhesive properties can be improved.;COPYRIGHT KIPO 2016
机译:本发明涉及具有改善的正向特性的碳化硅肖特基二极管及其制造方法。该方法包括:形成金属层的步骤,该金属层具有堆叠在外延层的上侧上的肖特基金属层,延伸势垒金属层和焊盘金属层。以及对蚀刻后的金属层进行热处理的步骤。从而,延伸阻挡金属层形成在焊盘金属层和肖特基金属层之间,从而具有防止肖特基金属层渗透到焊盘金属层中的效果。此外,通过高温热处理可降低界面电阻,并可以改善肖特基粘合性能。; COPYRIGHT KIPO 2016

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