首页> 外国专利> MIXED SAMPLE ANALYSIS SYSTEM USING OPTIMIZED METHOD OF CONCAVE DIFFRACTION GRATING

MIXED SAMPLE ANALYSIS SYSTEM USING OPTIMIZED METHOD OF CONCAVE DIFFRACTION GRATING

机译:凹面衍射光栅优化方法的混合样本分析系统

摘要

The present invention relates to a mixed sample analysis system using an optimized method of a concave diffraction grating. According to an embodiment of the present invention, the mixed sample analysis system using an optimized method of a concave diffraction grating comprises: a diffraction grating having a concave structure, wherein a focusing area is positioned at a constant deviation angle for each optical wavelength to split light reacted with a mixed sample; a linear light receiving element which is positioned in a gradient focusing area to receive the light split by the diffraction grating, and improves resolution of a specific area band; a diffraction grating rotating body to rotate the diffraction grating to adjust the specific area band; and a sample component analysis unit to check an electric signal value of the linear light receiving element to vary a number of linear simultaneous equations in accordance with a degree of the resolution, and display the electric signal value in a graph on a monitor screen.;COPYRIGHT KIPO 2016
机译:本发明涉及使用凹面衍射光栅的优化方法的混合样品分析系统。根据本发明的一个实施例,使用凹面衍射光栅的优化方法的混合样本分析系统包括:具有凹面结构的衍射光栅,其中聚焦区域以恒定的偏离角定位,以使每个光波长分开。光与混合样品发生反应;线性光接收元件,其位于梯度聚焦区域中以接收由衍射光栅分离的光,并提高特定区域带的分辨率;衍射光栅旋转体,使衍射光栅旋转以调节比面积带。样本成分分析单元,检查线性光接收元件的电信号值,以根据分辨率的程度改变线性联立方程的数量,并将电信号值显示在监视器屏幕上。版权KIPO 2016

著录项

  • 公开/公告号KR101619143B1

    专利类型

  • 公开/公告日2016-05-10

    原文格式PDF

  • 申请/专利权人 DONGWOO OPTRON;

    申请/专利号KR20150178794

  • 发明设计人 YEON KYU CHEOLKR;

    申请日2015-12-15

  • 分类号G01N21/31;G01J3/18;

  • 国家 KR

  • 入库时间 2022-08-21 14:12:34

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