SUBSTRATE FOR SURFACE-ENHANCED RAMAN-SCATTERING ANALYSIS

摘要

FIELD: physics, optics.;SUBSTANCE: substrate has a semiconductor surface having whisker crystals coated with a film of a metal selected from a group consisting of silver, gold, platinum, copper and/or alloys thereof. The material for the semiconductor surface used is a mixed nitride of aluminium, gallium and indium. Each formed whisker crystal has a linear defect inside. The surface density of the whisker crystals, having a linear defect inside, ranges from 10⁸/cm² and 10¹⁰/cm², and the length of the whisker crystals ranges from 0.2 mcm to 2.0 mcm, and the diameter of the whisker crystals ranges from 40 nm to 150 nm. The ratio of the length of the whisker crystals having a linear defect inside to their diameter ranges from 5 to 50, and the thickness of the metal film on the semiconductor surface ranges from 50 nm to 150 nm.;EFFECT: obtaining a substrate for surface-enhanced Raman-scattering analysis.;13 cl, 9 dwg, 3 ex