首页> 外国专利> AQUEOUS POLISHING COMPOSITION AND METHOD FOR CHEMICAL-MECHANICAL POLISHING OF SUBSTRATES HAVING POLYSILICON AND SILICON OXIDE DIELECTRIC FILMS

AQUEOUS POLISHING COMPOSITION AND METHOD FOR CHEMICAL-MECHANICAL POLISHING OF SUBSTRATES HAVING POLYSILICON AND SILICON OXIDE DIELECTRIC FILMS

机译:具有多晶硅和氧化硅电介质的基体的化学机械抛光的水抛光组合物和方法

摘要

FIELD: chemistry.;SUBSTANCE: invention relates to a novel aqueous polishing composition for polishing semiconductor substrates having polysilicon and silicon oxide dielectric films, and optionally having silicon nitride films. Said aqueous polishing composition contains (A) at least one type of abrasive particles, (B) 0.001-5.0 wt % of at least one water-soluble polymer, (C) at least one anionic phosphate dispersant. The abrasive particles (A) contain or consist of cerium dioxide, are positively charged during dispersion in an aqueous medium, are free of component (C) and have pH in the range of 3-9, which is confirmed by electrophoretic mobility. Component (B) is at least one water-soluble polymer selected from a group consisting of straight and branched alkylene oxide homopolymers and copolymers. The invention also relates to a method of polishing substrates for electrical, mechanical and optical devices using said aqueous polishing composition.;EFFECT: disclosed composition has considerably improved oxide/polysilicon selectivity and enables to obtain polished plates having excellent global and local flatness.;13 cl, 6 tbl, 9 ex
机译:发明领域本发明涉及一种新颖的水性抛光组合物,其用于抛光具有多晶硅和氧化硅介电膜并且可选地具有氮化硅膜的半导体衬底。所述水性抛光组合物包含(A)至少一种类型的磨料颗粒,(B)0.001-5.0wt%的至少一种水溶性聚合物,(C)至少一种阴离子磷酸酯分散剂。磨料颗粒(A)包含二氧化铈或由二氧化铈组成,在水性介质中分散时带正电,不含组分(C),pH值在3-9范围内,这可通过电泳迁移率确定。组分(B)是至少一种选自直链和支链环氧烷均聚物和共聚物的水溶性聚合物。本发明还涉及使用所述水性抛光组合物抛光用于电气,机械和光学装置的基材的方法。效果:所公开的组合物具有显着改善的氧化物/多晶硅选择性,并能够获得具有优异的整体和局部平坦度的抛光板; 13 cl,6 tbl,9 ex

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