DEVICE FOR DETERMINING SPECTRAL EMISSIVITY OF HEAT-SHIELDING MATERIALS AT HIGH TEMPERATURES

摘要

FIELD: measuring equipment.;SUBSTANCE: invention relates to measurement equipment and device for measuring emissivity of materials. Device comprises vacuum chamber, analysed sample, mechanism of rotation of sample, ohmic heater, spectrometer, computer and black body model. At that, heater at equal distance from rotation axis are heat flow probe, thermoelement sensors and cooled tube, which upper end is located at distance equal to 0.3-0.5 of distance from sample surface to heater, and behind tube lower end there is flat mirror for output of radiation to spectrometer through optical window in vacuum chamber.;EFFECT: technical result consists in providing the possibility of taking measurements at temperatures of over 1000 K.;1 cl, 2 dwg