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A method for the electrolytic deposition of gold to a copper - seed layer, in order to form a gold metallization structure

机译:一种将金电解沉积到铜种子层上以形成金金属化结构的方法

摘要

An electrically conductive barrier layer on a semiconductor substrate is formed in such a way that the barrier layer covers a first component connection. A seed layer is formed on the barrier layer. The seed layer comprises a gold different noble metal. The substrate is masked in such a way that a first mask opening to the side of the first connection is aligned. A unmasked section of the seed layer is using a gold electrolyte solution electroplated in such a way that a first gold metallization structure is formed in the first mask opening. The mask, the masked sections of the seed layer and the barrier layer are removed. The noble metal out of the unmasked section of the seed layer is in the first gold metallization structure is diffused. The first gold metallization structure, by means of the barrier layer is electrically connected with the first terminal.
机译:以这样的方式形成半导体衬底上的导电阻挡层,使得该阻挡层覆盖第一部件连接。在阻挡层上形成种子层。种子层包含不同的金贵金属。以这样的方式对基板进行掩模,即,对准在第一连接的侧面开口的第一掩模。种子层的未掩膜部分使用电镀的金电解质溶液,使得在第一掩膜开口中形成第一金金属化结构。去除掩模,种子层的掩模部分和阻挡层。贵金属从种子层的未掩盖部分中在第一金金属化结构中扩散。第一金金属化结构借助于阻挡层与第一端子电连接。

著录项

  • 公开/公告号DE102015115809A1

    专利类型

  • 公开/公告日2016-03-24

    原文格式PDF

  • 申请/专利权人 INFINEON TECHNOLOGIES AUSTRIA AG;

    申请/专利号DE201510115809

  • 发明设计人 ARNO ZECHMANN;

    申请日2015-09-18

  • 分类号H01L21/768;H01L23/522;

  • 国家 DE

  • 入库时间 2022-08-21 14:09:24

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