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Method of electrodepositing gold on a copper seed layer to form a gold metallization structure

机译:在铜籽晶层上电沉积金以形成金金属化结构的方法

摘要

An electrically conductive barrier layer is formed on a semiconductor substrate such that the barrier layer covers a first device terminal. A seed layer is formed on the barrier layer. The seed includes a noble metal other than gold. The substrate is masked so that a first mask opening is laterally aligned with the first terminal. An unmasked portion of the seed layer is electroplated using a gold electrolyte solution so as to form a first gold metallization structure in the first mask opening. The mask, the masked portions of the seed layer, and the barrier layer are removed. The noble metal from the unmasked portion of the seed layer is diffused into the first gold metallization structure. The first gold metallization structure is electrically connected to the first terminal via the barrier layer.
机译:导电阻挡层形成在半导体衬底上,使得阻挡层覆盖第一器件端子。在阻挡层上形成种子层。种子包括金以外的贵金属。掩蔽基板,使得第一掩膜开口与第一端子横向对准。使用金电解质溶液电镀种子层的未掩膜部分,以便在第一掩膜开口中形成第一金金属化结构。去除掩模,种子层的掩模部分和阻挡层。来自种子层的未掩盖部分的贵金属扩散到第一金金属化结构中。第一金金属化结构通过阻挡层电连接到第一端子。

著录项

  • 公开/公告号US9425090B2

    专利类型

  • 公开/公告日2016-08-23

    原文格式PDF

  • 申请/专利权人 INFINEON TECHNOLOGIES AUSTRIA AG;

    申请/专利号US201414491470

  • 发明设计人 ARNO ZECHMANN;

    申请日2014-09-19

  • 分类号H01L21/44;H01L21/768;H01L23/528;H01L23/532;

  • 国家 US

  • 入库时间 2022-08-21 14:30:52

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