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ICP EMISSION SPECTRAL ANALYSIS METHOD IMPROVED IN ANALYSIS ACCURACY

机译:分析精度改进的ICP发射光谱分析方法

摘要

PROBLEM TO BE SOLVED: To provide a method for correcting an analysis error due to ionization interference with a simple method and acquiring a quantitative value having high analysis accuracy in quantitative analysis using an ICP emission spectral analysis method.;SOLUTION: There is provided the ICP emission spectral analysis method configured to add a sodium compound and/or potassium compound to a reference sample solution for creating a calibration curve or both of the reference sample solution and a measured sample solution, so that density of sodium and/or potassium becomes almost equal in both solution, in the reference sample solution and the measured sample solution.;SELECTED DRAWING: None;COPYRIGHT: (C)2017,JPO&INPIT
机译:解决的问题:提供一种方法,该方法以简单的方法校正由于电离干扰引起的分析误差,并且在使用ICP发射光谱分析方法进行定量分析时获得具有较高分析精度的定量值。发射光谱分析方法,配置为向参考样品溶液中添加钠化合物和/或钾化合物,以创建参考样品溶液和被测样品溶液或两者的校准曲线,从而使钠和/或钾的密度几乎相等在两种溶液中,在参考样品溶液和被测样品溶液中;选定的图纸:无;版权:(C)2017,JPO&INPIT

著录项

  • 公开/公告号JP2017040569A

    专利类型

  • 公开/公告日2017-02-23

    原文格式PDF

  • 申请/专利权人 HAKUTO CO LTD;

    申请/专利号JP20150162731

  • 发明设计人 ANDO SETSUO;

    申请日2015-08-20

  • 分类号G01N21/73;

  • 国家 JP

  • 入库时间 2022-08-21 14:00:43

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