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In-Cu ALLOY SPUTTERING TARGET AND PRODUCTION METHOD THEREOF

机译:铜内合金溅射靶及其生产方法

摘要

PROBLEM TO BE SOLVED: To provide an In-Cu alloy sputtering target member having high composition uniformity in the thickness direction.SOLUTION: There is provided a sputtering target member having a composition containing Cu as much as 1-70 atom% to the total atomic number of In and Cu, and comprising residue In and inevitable impurities. In the sputtering target member, assuming that an atomic concentration of Cu to the total atomic number of In and Cu in one half in the thickness direction is A, and that an atomic concentration of Cu to the total atomic number of In and Cu in the other half in the thickness direction is B, and that B≥A is satisfied, 0.95≤A/B≤1 is satisfied, and the number of voids having the size of 100 μm or more is below 10/cmin average.SELECTED DRAWING: Figure 1
机译:解决的问题:提供一种在厚度方向上具有高组成均匀性的In-Cu合金溅射靶部件。解决方案:提供一种溅射靶部件,该溅射靶部件具有占总原子的1-70原子%的Cu。 In和Cu的数量,并且包含残留的In和不可避免的杂质。在溅射靶部件中,假设Cu相对于厚度方向的一半的In和Cu的总原子数的原子浓度为A,并且Cu相对于In和Cu的总原子数的原子浓度为A。厚度方向的另一半为B,并且满足B≥A,满足0.95≤A/B≤1,并且尺寸为100μm以上的空隙的数量低于10 / cmin的平均值。图1

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