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ELECTROCHEMICAL IMPEDANCE MEASURING DEVICE, ELECTROCHEMICAL IMPEDANCE ANALYSIS SUPPORT DEVICE, AND PROGRAM THEREFOR

机译:电化学阻抗测量装置,电化学阻抗分析支持装置及其程序

摘要

PROBLEM TO BE SOLVED: To provide devices and the like that enable electrochemical impedance measurement and analysis that place little work burden on users and make it difficult to produce large difference in results and work time due to skill levels or the like of the users.SOLUTION: About a complex impedance measurement result obtained from a measurement object, in addition to the graph of an imaginary part (vicinity of the far left (a) in a figure) of the result to a frequency, displayed is a graph obtained by plotting, to a frequency displayed by logarithm, inclination of points on a graph (vicinity of the far left (b) in the figure) which is both logarithmic display of the absolute value of the imaginary part to the frequency. When values of the vertical axis of the latter graph is not positive and negative symmetrical at frequencies before and after a peak in the former graph, it is known that a plurality of peaks are hidden in the peak in the former graph, a user uses the existence of the plurality of peaks to estimate an equivalent circuit corresponding to the chemical reaction system of the measurement object.SELECTED DRAWING: Figure 5
机译:要解决的问题:提供能够进行电化学阻抗测量和分析的设备等,其对用户的工作负担很小,并且由于用户的技术水平等原因,很难在结果和工作时间上产生很大的差异。 :关于从测量对象获得的复数阻抗测量结果,除显示结果的虚部(频率的最左端(a)附近)的图表外,还显示通过绘制而得到的图表,相对于通过对数显示的频率,曲线图上点的倾斜度(图中最左边的附近(b)的斜率)都是对数虚部绝对值相对于频率的对数显示。当后一图的纵轴的值在前一图的峰值之前和之后的频率处不是正负对称时,已知在前一图的峰值中隐藏了多个峰值,用户使用存在多个峰值以估算与测量对象的化学反应系统相对应的等效电路。选定的图:图5

著录项

  • 公开/公告号JP2017044651A

    专利类型

  • 公开/公告日2017-03-02

    原文格式PDF

  • 申请/专利权人 NATIONAL INSTITUTE FOR MATERIALS SCIENCE;

    申请/专利号JP20150169333

  • 发明设计人 KOBAYASHI KIYOSHI;

    申请日2015-08-28

  • 分类号G01R27/02;

  • 国家 JP

  • 入库时间 2022-08-21 14:00:04

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