Adhesion strength determination method for a metal thin film / polyimide laminate, and, metallized polyimide film substrate using the same

摘要

PROBLEM TO BE SOLVED: To provide a method for determining the quality of adhesion strength between a metal thin film and a polyimide film in a metal thin film/polyimide laminate in which the metal thin film is laminated on the surface of the polyimide film.SOLUTION: The orientation of molecular chains in an extreme surface on the lamination surface side of the polyimide film before lamination is measured using inclined view angle incident X-ray diffractometry. When a ratio of the maximum X-ray intensity to the minimum X-ray intensity showing the in-plane anisotropy of X-ray intensity is 1.05-1.40, the orientation is determined to be good. In a metalized polyimide film substrate using the polyimide film, the adhesion strength between the metal thin film and the polyimide film is increased.