首页> 外国专利> Method for repairing defects in graphene film and apparatus for measuring transmittance of graphene film

Method for repairing defects in graphene film and apparatus for measuring transmittance of graphene film

机译:修复石墨烯膜中的缺陷的方法和测量石墨烯膜的透射率的设备

摘要

PROBLEM TO BE SOLVED: To provide a measuring apparatus capable of measuring a local transmissivity of a graphene film in a micrometer order, and a defect repair method for the graphene film.SOLUTION: A defect repair method for a graphene film includes detecting a defective spot of the graphene film on a local area of the graphene film by Raman spectroscopic measurement, and irradiating the defective spot with a laser beam to repair the defective spot of the graphene film. The repairing of the defective spot of the local area includes: performing resonance Raman scattering measurement; identifying a local area in which a D band appears as the defective spot of the graphene film when a maximum peak intensity of a spectrum obtained by the resonance Raman scattering measurement in a range of 1310 cmor more and 1350 cmor less is defined as D; and irradiating a spot identified as the defective spot of the graphene film with the laser beam while supplying a carbon source to the spot to thereby repair the defect by filling it with the carbon source.
机译:解决的问题:提供一种能够以微米级测量石墨烯膜的局部透射率的测量装置以及该石墨烯膜的缺陷修复方法。解决方案:石墨烯膜的缺陷修复方法包括检测缺陷点。通过拉曼光谱测量法对石墨烯膜的局部区域上的石墨烯膜进行蚀刻,并用激光束照射缺陷点以修复石墨烯膜的缺陷点。局部缺陷点的修复包括:进行共振拉曼散射测量;以及当将通过共振拉曼散射测量获得的光谱的最大峰值强度在大于或等于1310cm且小于或等于1350cm的范围内定义为D时,识别出在石墨烯膜的缺陷点处出现D带的局部区域;在向该斑点供应碳源的同时,用激光束照射被识别为石墨烯膜的缺陷斑点的斑点,从而通过向该斑点填充碳源来修复该缺陷。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号