首页> 外国专利> SYSTEMS AND METHODS FOR ANALYZING SOFT ERRORS IN A DESIGN AND REDUCING THE ASSOCIATED FAILURE RATES THEREOF

SYSTEMS AND METHODS FOR ANALYZING SOFT ERRORS IN A DESIGN AND REDUCING THE ASSOCIATED FAILURE RATES THEREOF

机译:用于分析设计中的软错误并减少其相关故障率的系统和方法

摘要

Systems and methods for analyzing and reducing the failure rates due to soft errors in a design are provided. One such method involves analyzing the design by reading the design from a register-transfer-level language description or a netlist, manufacturing process soft error information, library information and timing constraints for the design to generate the failure in time (FIT) rate for the modules in the design. Another such method involves using the design and a list of memories that need error correction code inserted automatically and limiting the impact to the clock cycle, by analyzing the timing to the inputs and from the outputs of the memories and inserting an in-line or a late timing wrapper, which includes the ECC insert during writes, and ECC check and correct during reads, identifying the registers that need to be shadowed and used in the delayed ECC correct cycle, identifying the clock gating required for various elements in the design to get the correct logic at the conclusion of the re-play cycle of ECC correction in case of late timing ECC correction.
机译:提供了用于分析和减少由于设计中的软错误而导致的故障率的系统和方法。一种这样的方法涉及通过从寄存器传输级语言描述或网表读取设计来分析设计,制造过程软错误信息,库信息和设计的时序约束,以生成设计的时间故障率(FIT)。设计中的模块。另一种这样的方法涉及使用需要自动插入错误校正码的设计和存储器列表,并通过分析存储器输入端和输出端的时序并插入嵌入式或串行存储器来限制对时钟周期的影响。延迟时序包装器,包括写入过程中的ECC插入,以及读取过程中的ECC检查和纠正,确定需要被遮蔽并在延迟的ECC正确周期中使用的寄存器,确定设计中各个元素获得所需的时钟门控延迟ECC校正的情况下,在ECC校正重播周期结束时使用正确的逻辑。

著录项

  • 公开/公告号US2017213602A1

    专利类型

  • 公开/公告日2017-07-27

    原文格式PDF

  • 申请/专利权人 AUSTEMPER DESIGN SYSTEMS INC.;

    申请/专利号US201615285470

  • 发明设计人 SANJAY PILLAY;

    申请日2016-10-04

  • 分类号G11C29/12;G11C29/54;G06F17/50;G11C29/52;G11C11/412;

  • 国家 US

  • 入库时间 2022-08-21 13:51:02

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