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METHOD TO IMPROVE ANALOG FAULT COVERAGE USING TEST DIODES
METHOD TO IMPROVE ANALOG FAULT COVERAGE USING TEST DIODES
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机译:使用测试二极管改善模拟故障覆盖率的方法
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摘要
Implementations of integrated circuits may include: one or more diodes each having an anode and a cathode, each of the one or more diodes may be coupled with a voltage domain. One or more test pins may be coupled with one or more diodes. The test pins may be configured to be coupled to a tester. The one or more diodes may be positioned on one or more internal analog nodes to detect the presence of one or more analog faults. The one or more diodes may be configured to remain inactive during regular operation of the integrated circuit.
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