Apparatus and Method for Generating Signals for ESD Stress Testing an Electronic Device and System for Performing an ESD Stress Test of an Electronic Device

摘要

An apparatus and a method for generating signals for ESD stress testing an electronic device are disclosed. In an embodiment the apparatus is configured to receive a source signal including a source pulse, delay the source pulse to generate a test signal including a test pulse with a pulse width in an ESD time range and generate an auxiliary signal including an auxiliary pulse with a pulse width in the ESD time range.