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Apparatus and method for generating signals for ESD stress testing an electronic device and system for performing an ESD stress test of an electronic device
Apparatus and method for generating signals for ESD stress testing an electronic device and system for performing an ESD stress test of an electronic device
An apparatus and a method for generating signals for ESD stress testing an electronic device are disclosed. In an embodiment the apparatus is configured to receive a source signal including a source pulse, delay the source pulse to generate a test signal including a test pulse with a pulse width in an ESD time range and generate an auxiliary signal including an auxiliary pulse with a pulse width in the ESD time range.
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