首页> 外国专利> Method For Depositing A Crystal Layer At Low Temperatures, In Particular A Photoluminescent IV-IV Layer On An IV Substrate, And An Optoelectronic Component Having Such A Layer

Method For Depositing A Crystal Layer At Low Temperatures, In Particular A Photoluminescent IV-IV Layer On An IV Substrate, And An Optoelectronic Component Having Such A Layer

机译:在低温下沉积晶体层的方法,特别是在IV基板上的光致发光IV-IV层,以及具有这种层的光电组件

摘要

A method for monolithically depositing a monocrystalline IV-IV layer that glows when excited and that is composed of a plurality of elements of the IV main group, in particular a GeSn or Si—GeSn layer, the IV-IV layer having a dislocation density less than 6 cm−2, on an IV substrate, in particular a silicon or germanium substrate, including the following steps: providing a hydride of a first IV element (A), such as Ge2H6 or Si2H6; providing a halide of a second IV element (B), such as SnCl4; heating the substrate to a substrate temperature that is less than the decomposition temperature of the pure hydride or of a radical formed therefrom and is sufficiently high that atoms of the first element (A) and of the second element (B) are integrated into the surface in crystalline order, wherein the substrate temperature lies, in particular, in a range between 300° C. and 475° C.; producing a carrier gas flow of an inert carrier gas, in particular N2, Ar, He, which in particular is not H3; transporting the hydride and the halide and decomposition products arising therefrom to the surface at a total pressure of at most 300 mbar; depositing the IV-IV layer, or a layer sequence consisting of IV-IV layers of the same type, having a thickness of at least 200 nm, wherein the deposited layer is, in particular, a SiyGe1-x-ySn layer, with x0.08 and y≦1.
机译:一种整体沉积单晶IV-IV层的方法,该IV-IV层在激发时会发光并由IV主族的多种元素组成,尤其是GeSn或Si-GeSn层,该IV-IV层的位错密度较小在IV衬底上,特别是在硅或锗衬底上形成小于6cm -2 的膜,包括以下步骤:提供第一IV元素(A)的氢化物,例如Ge 2 H 6 或Si 2 H 6 ;提供第二种IV元素(B)的卤化物,例如SnCl 4 ;将衬底加热到​​衬底温度,该温度低于纯氢化物或由其形成的自由基的分解温度,并且其温度高到足以使第一元素(A)和第二元素(B)的原子整合到表面中以结晶顺序,其中衬底温度特别是在300℃至475℃之间的范围内;产生惰性载气,特别是N 2 ,Ar,He的载气流,所述惰性载气尤其不是H 3 ;以至多300 mbar的总压力将氢化物和卤化物以及由此产生的分解产物运输至表面;沉积IV-IV层或由相同类型的IV-IV层组成的层序列,其厚度至少为200 nm,其中沉积的层尤其是Si y Ge 1-xy Sn层,x> 0.08,y≤1。

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