首页>
外国专利>
TEST METHOD OF VOLATILE MEMORY DEVICE EMBEDDED IN ELECTRONIC DEVICE
TEST METHOD OF VOLATILE MEMORY DEVICE EMBEDDED IN ELECTRONIC DEVICE
展开▼
机译:电子设备中嵌入式存储器的测试方法
展开▼
页面导航
摘要
著录项
相似文献
摘要
A method of operation of an electronic device comprising a storage device in which a volatile memory device and a non-volatile memory device are embedded include initializing a memory controller connected to the volatile memory device, via a host connected to the storage device; obtaining first and second error-free regions in the volatile memory device by testing the volatile memory device using the memory controller via the host, the second error-free region being different from the first error-free region; generating an address map with respect to a defective cell region of the volatile memory device via the host, based on the testing; and executing program code of an operating system (OS) of the electronic device, the program code of the OS being stored in the non-volatile memory device, the executing including loading the OS to the volatile memory device based on the address map via the host.
展开▼