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METHOD FOR FABRICATING NANOWIRES FOR HORIZONTAL GATE ALL AROUND DEVICES FOR SEMICONDUCTOR APPLICATIONS

机译:用于半导体应用的水平门所有周围器件的纳米线制备方法

摘要

The present disclosure provides methods for forming nanowire spacers for nanowire structures with desired materials in horizontal gate-all-around (hGAA) structures for semiconductor chips. In one example, a method of forming nanowire spaces for nanowire structures on a substrate includes performing a lateral etching process on a substrate having a multi-material layer disposed thereon, wherein the multi-material layer including repeating pairs of a first layer and a second layer, the first and second layers each having a first sidewall and a second sidewall respectively exposed in the multi-material layer, wherein the lateral etching process predominately etches the second layer through the second layer forming a recess in the second layer, filling the recess with a dielectric material, and removing the dielectric layer over filled from the recess.
机译:本公开提供了用于形成具有用于半导体芯片的水平围绕栅(hGAA)结构的期望材料的用于纳米线结构的纳米线间隔物的方法。在一个示例中,一种在基板上形成用于纳米线结构的纳米线空间的方法包括在其上布置有多材料层的基板上执行侧向蚀刻工艺,其中,该多材料层包括第一和第二层的重复对。在第一层和第二层中,第一层和第二层分别具有分别暴露在多材料层中的第一侧壁和第二侧壁,其中,横向蚀刻工艺主要通过第二层对第二层进行蚀刻,从而在第二层中形成凹槽,从而填充凹槽用电介质材料,并从凹槽中去除填充的电介质层。

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