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Structures for split gate memory cell scaling with merged control gates

机译:具有合并控制门的拆分门存储单元缩放的结构

摘要

A memory device has first and second memory cells in and over a substrate. A first doped region is in a first active region. A top surface of the first active region is substantially coplanar with a top surface of the first doped region. A control gate is over the first doped region and extends over a first side of the first doped region and over a second side of the first doped region. A charge storage layer is between the first control gate and the first active region including between the first select gate and the first doped region. A first select gate is over the first active region on the first side of the first doped region and adjacent to the control gate. A second select gate is over the first active region on the second side of the first doped region and adjacent to the control gate.
机译:一种存储器件,其在衬底之中和之上具有第一和第二存储单元。第一掺杂区在第一有源区中。第一有源区的顶表面与第一掺杂区的顶表面基本共面。控制栅极在第一掺杂区域上方并且在第一掺杂区域的第一侧上方和第一掺杂区域的第二侧上方延伸。电荷存储层在第一控制栅和第一有源区之间,包括在第一选择栅和第一掺杂区之间。第一选择栅在第一掺杂区的第一侧上的第一有源区上方并且与控制栅相邻。第二选择栅在第一掺杂区的第二侧上的第一有源区上方并且与控制栅相邻。

著录项

  • 公开/公告号US9620604B2

    专利类型

  • 公开/公告日2017-04-11

    原文格式PDF

  • 申请/专利权人 FREESCALE SEMICONDUCTOR INC.;

    申请/专利号US201615014267

  • 发明设计人 ANIRBAN ROY;KO-MIN CHANG;

    申请日2016-02-03

  • 分类号H01L29/788;H01L29/792;H01L27/11521;H01L29/423;H01L27/1157;H01L21/28;H01L29/66;H01L27/11568;

  • 国家 US

  • 入库时间 2022-08-21 13:46:36

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