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Devices and methods of forming VFET with self-aligned replacement metal gates aligned to top spacer post top source drain EPI

机译:形成具有自对准替代金属栅极的VFET的器件和方法,该金属栅极与顶部隔离物在顶部源极漏极EPI之后对齐

摘要

Devices and methods of fabricating vertical field effect transistors on semiconductor devices are provided. One intermediate semiconductor includes: a substrate, a bottom spacer layer above the substrate, a plurality of fins, wherein at least one fin is an n-fin and at least one fin is a p-fin; a high-k layer and a work function metal over the bottom spacer layer and around the plurality of fins; a top spacer above the high-k layer and the work function metal and surrounding a top area of the fins; a top source/drain structure over each fin; a dielectric capping layer over the top source/drain structure; a fill metal surrounding the work function metal; and a liner.
机译:提供了在半导体器件上制造垂直场效应晶体管的器件和方法。一种中间半导体,包括:衬底;衬底上方的底部间隔层;多个鳍,其中,至少一个鳍为n鳍,至少一个鳍为p鳍;高k层和功函数金属在底部间隔层上方和多个鳍片周围;高k层和功函数金属上方的顶部隔离物,并围绕鳍的顶部区域;每个鳍片上方的顶部源极/漏极结构;顶部源极/漏极结构上方的电介质覆盖层;围绕功函数金属的填充金属;和班轮。

著录项

  • 公开/公告号US9773708B1

    专利类型

  • 公开/公告日2017-09-26

    原文格式PDF

  • 申请/专利权人 GLOBALFOUNDRIES INC.;

    申请/专利号US201615245634

  • 发明设计人 STEVEN BENTLEY;KWAN-YONG LIM;JOHN ZHANG;

    申请日2016-08-24

  • 分类号H01L21/8238;H01L29/786;H01L29/423;H01L29/49;H01L29/06;H01L29/167;H01L29/66;H01L27/092;

  • 国家 US

  • 入库时间 2022-08-21 13:45:48

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