Memory device with reduced test time

摘要

In some examples, a memory device generates and exposes parity/difference information to a test system to reduce overall test time. The parity/difference information may be generated based on parity bits read from the memory device and parity bits produced from data bits stored in the memory device. In some cases, the parity/difference information may be compared to an expected parity/difference to determine a number of correctable errors which occurred during testing, while the data bits may be compared to expected data to determine a number of uncorrectable errors which occurred during testing.