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Systems and methods for test time outlier detection and correction in integrated circuit testing
Systems and methods for test time outlier detection and correction in integrated circuit testing
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机译:用于集成电路测试中的测试时间异常值检测和校正的系统和方法
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摘要
Methods and systems for semiconductor testing are disclosed. In one embodiment, devices which are testing too slowly are prevented from completing testing, thereby allowing untested devices to begin testing sooner.
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