method of determining optical properties of materials on the basis of the anomalous refraction in u0440u0435u0444u0440u0430u043au0446u0438u043eu043du043du044bu0445 optical elements

摘要

the invention belongs to the field of u0440u0435u043du0442u0433u0435u043du043eu0442u0435u0445u043du0438u043au0438 and can be used for the control of chemical composition and structure of substances.the technical result, which aims at obtaining the utility model is a device for the control of chemical composition and characteristics of the thing pts in u043au043eu043du0434u0435u043du0441u0438u0440u043eu0432u0430u043du043du043eu043c condition, with the simplicity of design and the interpretation of the results.the technical result is achieved in the utility model, which is located on the optical axis has a source of x-ray radiation, perez u0442u0440u0430u0438u0432u0430u0435u043cu044bu0439 monochromator for an x-ray u0437u043eu043du0434u0438u0440u0443u044eu0449u0435u0435 some energy, a sample of the substance is in the form (e u0444u043eu043au0443u0441u0438u0440u0443u044eu0449u0435u0433u043e element, as well as coordinate sensitive detectorfor the measurement of the diameter of a lens focusing the beam.