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DEVICE FOR DETERMINING THE OPTICAL PROPERTIES ON THE BASIS anomalous refraction in refractive optical elements

机译:用于确定基于折射光学元件中的异常折射的光学性质的装置

摘要

The invention relates to the field of X-ray technology and can be used to control chemical composition and structure of the substance. Technical result is directed to the utility model is to provide a device for monitoring the chemical composition and characteristics of the substances present in the condensed state characterized by simplicity of design and interpretation of the results. The technical result is achieved in the utility model, comprising, arranged in series on the same optical axis, x-ray source, tunable monochromator provides output probing X-ray radiation of a certain energy sample from the test substance formed as a focusing element as well as the coordinate-sensitive detector, providing measurement of the diameter of the focused beam lens. NP 1, PO 4, 1 IL.
机译:本发明涉及X射线技术领域,可用于控制物质的化学组成和结构。技术结果是针对本实用新型的,目的是提供一种用于监测缩合状态下存在的物质的化学组成和特性的装置,该装置的特征在于设计简单和对结果的解释。在本实用新型中实现了技术成果,包括在同一光轴上串联排列的X射线源,可调谐单色仪提供对来自形成为聚焦元件的被测物质的某种能量样本的X射线辐射的输出探测。以及坐标敏感检测器,可测量聚焦光束透镜的直径。 NP 1,PO 4、1 IL。

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