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COMPOSITE SUBSTRATE AND METHOD FOR ESTIMATING THICKNESS TREND OF PIEZOELECTRIC SUBSTRATE

机译:复合基质和估计压电基质厚度趋势的方法

摘要

A composite substrate of the present invention is a composite substrate provided with a support substrate having a diameter of 2 inches or more, and a piezoelectric substrate bonded to the support substrate, the piezoelectric substrate having a thickness of not more than 20 μm and transmitting light, wherein the piezoelectric substrate has a banded thickness distribution, the thickness distribution of the piezoelectric substrate having, in a cross section of the composite substrate taken along a line perpendicular to the bands, a waveform with an amplitude in the thickness direction of not less than 5 nm and not more than 100 nm, and with a pitch in a width direction of not less than 0.5 mm and not more than 20 mm, wherein the pitch of the waveform has a correlation with the width of the bands. In the piezoelectric substrate, the bands may be parallel bands, spiral bands, or concentric bands.
机译:本发明的复合基板是一种复合基板,该复合基板具备:直径为2英寸以上的支撑基板;和与该支撑基板接合的压电基板,该压电基板的厚度为20μm以下,并且使光透射。 2.根据权利要求1所述的压电基板,其中,所述压电基板的厚度分布为带状,所述压电基板的厚度分布在所述复合基板的沿垂直于所述带的线的截面中具有在厚度方向上的振幅不小于2mm的波形。 5nm且100nm以下,且宽度方向的间距为0.5mm以上20mm以下,其中,波形的间距与频带的宽度相关。在压电基板中,带可以是平行带,螺旋带或同心带。

著录项

  • 公开/公告号WO2017047605A1

    专利类型

  • 公开/公告日2017-03-23

    原文格式PDF

  • 申请/专利权人 NGK INSULATORS LTD.;

    申请/专利号WO2016JP77033

  • 发明设计人 NAGAE TOMOKI;KOIZUMI AYATO;

    申请日2016-09-14

  • 分类号H01L41/337;H01L41/053;H01L41/08;H01L41/313;H03H3/08;H03H9/25;

  • 国家 WO

  • 入库时间 2022-08-21 13:31:42

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