首页> 外国专利> METHOD FOR MEASURING THREE-DIMENSIONAL SHAPE OF SILICA GLASS CRUCIBLE AND METHOD FOR PRODUCING MONOCRYSTALLINE SILICON

METHOD FOR MEASURING THREE-DIMENSIONAL SHAPE OF SILICA GLASS CRUCIBLE AND METHOD FOR PRODUCING MONOCRYSTALLINE SILICON

机译:二氧化硅玻璃坩埚三维形状的测量方法及单晶硅的生产方法

摘要

A three-dimensional shape measuring method of a silica glass crucible capable of measuring a three-dimensional shape of an inner surface of a crucible without contaminating the inner surface of the crucible. According to the present invention, there is provided a silica glass crucible comprising a step of causing turbidity on the inner surface of a silica glass crucible, a step of irradiating light to the inner surface, and a step of measuring the three-Dimensional shape measuring method of the present invention.;
机译:石英玻璃坩埚的三维形状测量方法,该方法能够测量坩埚内表面的三维形状而不会污染坩埚的内表面。根据本发明,提供了一种石英玻璃坩埚,其包括在石英玻璃坩埚的内表面上引起浑浊的步骤,向内表面照射光的步骤以及测量三维形状测量的步骤。本发明的方法。

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