首页> 外国专利> FREE LAYER HAVING LOW BORON CONCENTRATION REGION AND HIGH BORON CONCENTRATION REGION, MAGNETO-RESISTIVE CELL, MAGNETO-RESISTIVE MEMORY DEVICE, AND METHOD OF FABRICATING SAME

FREE LAYER HAVING LOW BORON CONCENTRATION REGION AND HIGH BORON CONCENTRATION REGION, MAGNETO-RESISTIVE CELL, MAGNETO-RESISTIVE MEMORY DEVICE, AND METHOD OF FABRICATING SAME

机译:具有低硼浓度区和高硼浓度区的自由层,磁阻单元,磁阻存储器件及其制造方法

摘要

Disclosed is a method of forming a magneto-resistive memory device, capable of improving data preservation characteristics while reducing power consumption. The method of forming a magneto-resistive memory device includes the steps of: forming a magnetic layer; forming a tunneling barrier layer on the magnetic layer; forming a first preliminary free layer containing boron on the tunneling barrier layer; forming a first buffer layer on the first preliminary free layer; performing a first annealing process to convert the first preliminary free layer into a second preliminary free layer and the first buffer layer into a first boride layer; performing an etching process to remove the first boride layer; forming a second buffer layer on the second preliminary free layer; performing a second annealing process to convert the second preliminary free layer into a free layer and the second buffer layer into a second boride layer; and performing an oxidation process to convert the second boride layer into an oxide layer.;COPYRIGHT KIPO 2017
机译:公开了一种形成磁阻存储装置的方法,其能够在降低功耗的同时改善数据保存特性。形成磁阻存储装置的方法包括以下步骤:形成磁性层;以及形成磁性层。在磁性层上形成隧道势垒层;在隧穿势垒层上形成包含硼的第一初步自由层;在第一初步自由层上形成第一缓冲层;进行第一退火工艺以将第一初步自由层转化为第二初步自由层,并将第一缓冲层转化为第一硼化物层;进行蚀刻工艺以去除第一硼化物层;在第二初步自由层上形成第二缓冲层;进行第二退火工艺,以将第二初步自由层转化为自由层,第二缓冲层转化为第二硼化物层;并进行氧化工艺以将第二硼化物层转化为氧化物层。; COPYRIGHT KIPO 2017

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