首页> 外国专利> KELVIN TEST PROBE KELVIN TEST PROBE MODULE AND MANUFACTURING METHOD THEREOF

KELVIN TEST PROBE KELVIN TEST PROBE MODULE AND MANUFACTURING METHOD THEREOF

机译:开尔文测试探针开尔文测试探针及其制造方法

摘要

The present invention relates to a probe for a Kelvin test, a probe module for a Kelvin test, and a manufacturing method thereof. The probe for a Kelvin test according to the present invention comprises: an upper insulating sheet made of a flexible material; a lower insulating sheet made of the flexible material; an insulating elastic member connecting the upper insulating sheet and the lower insulating sheet; a first upper conductive pad formed on one surface of the upper insulating sheet; a second upper conductive pad formed on the other surface of the upper insulating sheet; a first upper conductive pin attached to the first upper conductive pad; a second upper conductive pin attached to the second upper conductive pad; a first lower conductive pad formed on one surface of the lower insulating sheet; a second lower conductive pad formed on the other surface of the lower insulating sheet; a first lower conductive pin; a second lower conductive pin; a first conductive wire; and a second conductive wire. The present invention can reduce manufacturing costs and ensure stable contact.
机译:本发明涉及用于开尔文测试的探针,用于开尔文测试的探针模块及其制造方法。根据本发明的用于开尔文测试的探针包括:由柔性材料制成的上绝缘片;以及由绝缘材料制成的绝缘片。由柔性材料制成的下部绝缘片;绝缘弹性构件,其连接上绝缘片和下绝缘片。第一上导电垫形成在上绝缘片的一个表面上;第二上导电垫形成在上绝缘片的另一表面上;第一上导电引脚,其连接到第一上导电焊盘;第二上导电销钉附接到第二上导电垫;第一下导电垫形成在下绝缘片的一个表面上;第二下导电垫形成在下绝缘片的另一表面上;第一下部导电销;第二下部导电引脚;第一导线;第二根导线。本发明可以降低制造成本并确保稳定的接触。

著录项

  • 公开/公告号KR20170042398A

    专利类型

  • 公开/公告日2017-04-19

    原文格式PDF

  • 申请/专利权人 INNO GLOBAL INC.;

    申请/专利号KR20150141415

  • 发明设计人 LEE EUN JOU;

    申请日2015-10-08

  • 分类号G01R1/067;G01R1/073;G01R3;

  • 国家 KR

  • 入库时间 2022-08-21 13:27:45

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